I just got back from the 8th International Conference on Software QA and Testing for Embedded Systems, Oct 21 – 23. This was my first time at this conference and I’d give it a high grade for the overall quality of the content and speakers, and in particular, for the people who organize this conference. They are first class. Thanks to my new friends at SQS S.A., Spain — Sander Hanenberg, Jesús M. de la Maza and Begoña Laibara — for treating me well during the conference.
There was an IEEE conference in July, hosted at the University of Limerick.
International Conference on Global Software Development/Engineering
I had the privilege to visit and present at the 2009 Star West conference in the Disneyland Hotel in Anaheim.
I got some comments on my post “Test Everything all the Time” — most notably people commenting that it’s impossible to test “everything”. I can’t agree more. The intention of the post was to make the point that we need to be able to test “everything we can” all the time. That is, you should be constantly iterating your automation, and not “waiting to run” the automation. Also, the point was to talk about how test design can solve all of your problems, not the automation tool. The tool is just an means to an end.